PublisherDOIYearVolumeIssuePageTitleAuthor(s)Link
Non-Destructive Testing10.1016/0029-1021(76)90003-719769266-70Electronic noise in acoustic-emission measurementsJ. Holthttps://api.elsevier.com/content/article/PII:0029102176900037?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102176900037?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(71)90012-0197143198-200Spectroscopic techniques of thickness measurementsA.M. Deane, E.W.T. Richardshttps://api.elsevier.com/content/article/PII:0029102171900120?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102171900120?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(76)90051-719769155Non-destructive testingR. Sharpehttps://api.elsevier.com/content/article/PII:0029102176900517?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102176900517?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(75)90080-8197584205-206Holographic non-destructive testinghttps://api.elsevier.com/content/article/PII:0029102175900808?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102175900808?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(75)90030-4197586308Non-destructive testinghttps://api.elsevier.com/content/article/PII:0029102175900304?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102175900304?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(69)90089-919692153Non-destructive testingH.L. Carsonhttps://api.elsevier.com/content/article/PII:0029102169900899?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102169900899?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(69)90091-719692155Non-destructive testing techniquesC.C. Bateshttps://api.elsevier.com/content/article/PII:0029102169900917?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102169900917?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(68)90234-x196816403Training courses in non-destructive testinghttps://api.elsevier.com/content/article/PII:002910216890234X?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:002910216890234X?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(68)90047-9196815323Training courses in non-destructive testinghttps://api.elsevier.com/content/article/PII:0029102168900479?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102168900479?httpAccept=text/plain
Non-Destructive Testing10.1016/0029-1021(67)90025-419671267Why publish non-destructive testing?https://api.elsevier.com/content/article/PII:0029102167900254?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0029102167900254?httpAccept=text/plain